X-ray Absorption Spectroscopy for the Chemical and Materials Sciences by John Evans

Author:John Evans
Language: eng
Format: epub
ISBN: 9781118676189
Publisher: John Wiley & Sons, Inc.
Published: 2018-01-23T00:00:00+00:00

The measurement of RIXS data is achieved by recording a series of XAFS spectra with a stack of emission energies, and the natural way to present this is as in Figure 4.32a. Here there is a contour map of the If /I0 values for the energy of incoming and outgoing x‐radiation. The horizontal line through the emission maxima (Figure 4.31) is the HERFD spectrum in Figure 4.28. The vertical lines will be emission spectra measured at different excitation energies. The variations shown in Figure 4.31 can be envisaged as coming from different slices through the structured patterns below an excitation energy of ~8990 eV.

Figure 4.32 Kα1 RIXS spectra of CuO plotted with 32 contours of If/I0. Axes used are the excitation and a) emission or b) transfer energies.

(Source: Diamond, I20)

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